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31.080.01 Semiconductor devices in general
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Draft BS EN 63608-1 Semiconductor devices - Reliability evaluation methods for vibration energy harvesters Part 1: Mechanical reliability under shock
Draft BS EN 63608-1 Semiconductor devices - Reliability evaluation methods for vibration energy harvesters Part 1: Mechanical reliability under shock
Released: 2025-02-06
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BS EN IEC 63378-3:2025
Thermal standardization on semiconductor packages Thermal circuit simulation models of discrete semiconductor packages for transient analysis
Thermal standardization on semiconductor packages Thermal circuit simulation models of discrete semiconductor packages for transient analysis
Released: 2025-06-24
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BS EN IEC 60749-23:2026 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods High temperature operating life
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods High temperature operating life
Released: 2026-02-12
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BS EN IEC 60749-26:2026 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Released: 2026-02-27
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BS IEC 60747-16-11:2026
Semiconductor devices Microwave integrated circuits. Power detectors
Semiconductor devices Microwave integrated circuits. Power detectors
Released: 2026-04-15
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BS EN IEC 62007-2:2025
Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Released: 2025-09-23
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BS EN 60191-3:2000
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of integrated circuits
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of integrated circuits
Released: 2000-06-15
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