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31.080.01 Semiconductor devices in general
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BS IEC 60747-18-4:2023
Semiconductor devices Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
Semiconductor devices Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
Released: 2023-03-27
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BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Released: 2022-11-11
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24/30491834 DC
Draft BS EN 60747-14-12 ED1 Semiconductor devices Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors
Draft BS EN 60747-14-12 ED1 Semiconductor devices Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors
Released: 2024-04-23
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BS EN IEC 60749-34-1:2025
Semiconductor devices. Mechanical and climatic test methods Power cycling test for power semiconductor module
Semiconductor devices. Mechanical and climatic test methods Power cycling test for power semiconductor module
Released: 2025-08-18
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25/30511332 DC
Draft BS EN 60747-17 Ed.2.0 Semiconductor devices Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
Draft BS EN 60747-17 Ed.2.0 Semiconductor devices Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
Released: 2025-08-26
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BS EN IEC 60749-21:2026 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Solderability
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Solderability
Released: 2026-02-12
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