Log inSign up
LANGUAGE en
Menu
STOREABOUT US Help centerContactsDelivery chargesNews
SEARCH
0
Total price
0 USD
PRICES include / exclude VAT
Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>BS IEC 63284:2022 Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Sponsored link
immediate downloadReleased: 2022-11-11
BS IEC 63284:2022 Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors

BS IEC 63284:2022

Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors

Format
Availability
Price and currency
English Secure PDF
Immediate download
195.00 USD
English Hardcopy
In stock
195.00 USD
Standard number:BS IEC 63284:2022
Pages:16
Released:2022-11-11
ISBN:978 0 539 12643 3
Status:Standard
DESCRIPTION

BS IEC 63284:2022


This standard BS IEC 63284:2022 Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors is classified in these ICS categories:
  • 31.080.30 Transistors
  • 31.080.01 Semiconductor devices in general
  • 31.080.99 Other semiconductor devices

Print