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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>BS IEC 63284:2022 Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
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immediate downloadReleased: 2022-11-11
BS IEC 63284:2022 Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors

BS IEC 63284:2022

Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors

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Standard number:BS IEC 63284:2022
Pages:16
Released:2022-11-11
ISBN:978 0 539 12643 3
Status:Standard
DESCRIPTION

BS IEC 63284:2022


This standard BS IEC 63284:2022 Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors is classified in these ICS categories:
  • 31.080.30 Transistors
  • 31.080.01 Semiconductor devices in general
  • 31.080.99 Other semiconductor devices

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