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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>BS EN 60749-2:2002 Semiconductor devices. Mechanical and climatic test methods Low air pressure
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immediate downloadReleased: 2002-09-24
BS EN 60749-2:2002 Semiconductor devices. Mechanical and climatic test methods Low air pressure

BS EN 60749-2:2002

Semiconductor devices. Mechanical and climatic test methods Low air pressure

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Standard number:BS EN 60749-2:2002
Pages:10
Released:2002-09-24
ISBN:0 580 40397 1
Status:Standard
DESCRIPTION

BS EN 60749-2:2002


This standard BS EN 60749-2:2002 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general
Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures is only applicable to devices where the operating voltage exceeds 1 000 V. This test is applicable to all semiconductor devices provided they are in cavity type packages. The test is intended for military and space-related applications only. The contents of the corrigendum of August 2003 have been included in this copy.