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31.080.01 Semiconductor devices in general
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BS IEC 62615:2010
Electrostatic discharge sensitivity testing. Transmission line pulse (TLP). Component level
Electrostatic discharge sensitivity testing. Transmission line pulse (TLP). Component level
Released: 2011-07-31
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313.88 USD
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BS EN 60749-24:2004
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Released: 2004-06-24
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192.12 USD
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BS 7241:1989
Specification for IEC 822 VSB: parallel sub-system bus of the IEC 821 VME bus
Specification for IEC 822 VSB: parallel sub-system bus of the IEC 821 VME bus
Released: 1990-03-30
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470.82 USD
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BS EN 62298-3:2005
Teleweb application Superteletext profile
Teleweb application Superteletext profile
Released: 2005-10-14
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470.82 USD
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BS IEC 60747-10:1991
Semiconductor devices Generic specification for discrete devices and integrated circuits
Semiconductor devices Generic specification for discrete devices and integrated circuits
Released: 2011-07-31
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368.00 USD
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368.00 USD
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192.12 USD
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BS EN 62007-2:2009
Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Released: 2009-10-31
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368.00 USD
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BS EN 61582:2006
Radiation protection instrumentation. In vivo counters. Classification, general requirements and test procedures for portable, transportable and installed equipment
Radiation protection instrumentation. In vivo counters. Classification, general requirements and test procedures for portable, transportable and installed equipment
Released: 2006-06-30
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435.65 USD
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BS EN IEC 60749-17:2019
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Released: 2019-05-15
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BS IEC 60747-14-10:2019
Semiconductor devices Semiconductor sensors. Performance evaluation methods for wearable glucose sensors
Semiconductor devices Semiconductor sensors. Performance evaluation methods for wearable glucose sensors
Released: 2019-11-22
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368.00 USD
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BS IEC 62951-8:2023
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for stretchability, flexibility, and stability of flexible resistive memory
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for stretchability, flexibility, and stability of flexible resistive memory
Released: 2023-01-24
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224.59 USD
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BS EN IEC 63364-1:2022
Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection
Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection
Released: 2023-02-02
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224.59 USD
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