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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>BS EN 60749-29:2011 Semiconductor devices. Mechanical and climatic test methods Latch-up test
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BS EN 60749-29:2011 Semiconductor devices. Mechanical and climatic test methods Latch-up test

BS EN 60749-29:2011

Semiconductor devices. Mechanical and climatic test methods Latch-up test

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Standard number:BS EN 60749-29:2011
Pages:26
Released:2011-08-31
ISBN:978 0 580 69138 6
Status:Standard
DESCRIPTION

BS EN 60749-29:2011


This standard BS EN 60749-29:2011 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general
IEC 60749-29:2011 covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is toestablish a method for determining integrated circuit (IC) latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "no trouble found" (NTF) and "electrical overstress" (EOS) failures due to latch-up. This second edition cancels and replaces the first edition published in 2003 and constitutes a technical revision. The significant changes with respect to the previous edition include:
- a number of minor technical changes;
- the addition of two new annexes covering the testing of special pins and temperature calculations.