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immediate downloadReleased: 2011-08-31
BS EN 60749-29:2011
Semiconductor devices. Mechanical and climatic test methods Latch-up test
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Standard number: | BS EN 60749-29:2011 |
Pages: | 26 |
Released: | 2011-08-31 |
ISBN: | 978 0 580 69138 6 |
Status: | Standard |
DESCRIPTION
BS EN 60749-29:2011
This standard BS EN 60749-29:2011 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
- 31.080.01 Semiconductor devices in general
- a number of minor technical changes;
- the addition of two new annexes covering the testing of special pins and temperature calculations.