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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>BS EN 60749-24:2004 Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
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immediate downloadReleased: 2004-06-24
BS EN 60749-24:2004 Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST

BS EN 60749-24:2004

Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST

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Standard number:BS EN 60749-24:2004
Pages:10
Released:2004-06-24
ISBN:0 580 43972 0
Status:Standard
DESCRIPTION

BS EN 60749-24:2004


This standard BS EN 60749-24:2004 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general
The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.