PRICES include / exclude VAT
31.080.01 Semiconductor devices in general
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
BS IEC 60747-14-10:2019
Semiconductor devices Semiconductor sensors. Performance evaluation methods for wearable glucose sensors
Semiconductor devices Semiconductor sensors. Performance evaluation methods for wearable glucose sensors
Released: 2019-11-22
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
368.00 USD
English Hardcopy
In stock
368.00 USD
BS IEC 62951-8:2023
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for stretchability, flexibility, and stability of flexible resistive memory
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for stretchability, flexibility, and stability of flexible resistive memory
Released: 2023-01-24
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
224.59 USD
English Hardcopy
In stock
224.59 USD
BS EN IEC 62435-9:2021
Electronic components. Long-term storage of electronic semiconductor devices Special cases
Electronic components. Long-term storage of electronic semiconductor devices Special cases
Released: 2021-10-11
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
224.59 USD
English Hardcopy
In stock
224.59 USD
BS EN IEC 60749-5:2024
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Released: 2024-02-06
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
224.59 USD
English Hardcopy
In stock
224.59 USD
BS IEC 60747-5-15:2022
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on the electroreflectance spectroscopy
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on the electroreflectance spectroscopy
Released: 2022-07-19
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
213.76 USD
English Hardcopy
In stock
213.76 USD
BS EN IEC 63364-1:2022
Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection
Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection
Released: 2023-02-02
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
224.59 USD
English Hardcopy
In stock
224.59 USD
BS IEC 62047-37:2020
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Released: 2023-04-05
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
224.59 USD
English Hardcopy
In stock
224.59 USD
24/30497861 DC
BS EN IEC 63551-1. Semiconductor devices. Detection modules of autonomous land vehicle Part 1. Testing methods of detection performance for LiDAR
BS EN IEC 63551-1. Semiconductor devices. Detection modules of autonomous land vehicle Part 1. Testing methods of detection performance for LiDAR
Released: 2024-08-01
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
27.06 USD
English Hardcopy
In stock
27.06 USD
25/30511310 DC
Draft BS EN 62047-56 Micro-electromechanical devices Part 56. Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor
Draft BS EN 62047-56 Micro-electromechanical devices Part 56. Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor
Released: 2025-07-21
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
27.06 USD
English Hardcopy
In stock
27.06 USD
BS EN IEC 62007-2:2025 - TC
Tracked Changes. Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Tracked Changes. Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Released: 2025-10-10
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
581.76 USD
English Hardcopy
In stock
581.76 USD
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
27.06 USD
English Hardcopy
In stock
27.06 USD
BS EN IEC 60749-22-2:2026
Semiconductor devices — Mechanical and climatic test methods Bond strength — Wire bond shear test methods
Semiconductor devices — Mechanical and climatic test methods Bond strength — Wire bond shear test methods
Released: 2026-01-21
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
368.00 USD
English Hardcopy
In stock
368.00 USD