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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>BS EN 60749-25:2003 Semiconductor devices. Mechanical and climatic test methods Temperature cycling
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immediate downloadReleased: 2003-10-30
BS EN 60749-25:2003 Semiconductor devices. Mechanical and climatic test methods Temperature cycling

BS EN 60749-25:2003

Semiconductor devices. Mechanical and climatic test methods Temperature cycling

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Standard number:BS EN 60749-25:2003
Pages:16
Released:2003-10-30
ISBN:0 580 42859 1
Status:Standard
DESCRIPTION

BS EN 60749-25:2003


This standard BS EN 60749-25:2003 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general
Provides a test procedure for determining the ability of semiconductor devices and components and/or board assemblies to withstand mechanical stresses induced by alternating high and low temperature extremes. Permanent changes in electrical and/or physical characteristics can result from these mechanical stresses. Applies to single, dual and triple chamber temperature cycling and covers component and solder interconnection testing.