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>BSI Standards >71 CHEMICAL TECHNOLOGY>71.040 Analytical chemistry>71.040.40 Chemical analysis>25/30469630 DC BS ISO 4508 Surface chemical analysis - Scanning probe microscopy - Guideline for the method and procedure for determining the temperature effects on AFM dimensional measurements
immediate downloadReleased: 2025-02-06
25/30469630 DC BS ISO 4508 Surface chemical analysis - Scanning probe microscopy - Guideline for the method and procedure for determining the temperature effects on AFM dimensional measurements

25/30469630 DC

BS ISO 4508 Surface chemical analysis - Scanning probe microscopy - Guideline for the method and procedure for determining the temperature effects on AFM dimensional measurements

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Standard number:25/30469630 DC
Pages:21
Released:2025-02-06
Status:Draft for Comment
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25/30469630 DC


This standard 25/30469630 DC BS ISO 4508 Surface chemical analysis - Scanning probe microscopy - Guideline for the method and procedure for determining the temperature effects on AFM dimensional measurements is classified in these ICS categories:
  • 71.040.40 Chemical analysis

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