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Homepage>BSI Standards >37 IMAGE TECHNOLOGY>37.020 Optical equipment>25/30505052 DC BS ISO 25387 Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope
immediate downloadReleased: 2025-07-18
25/30505052 DC BS ISO 25387 Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope

25/30505052 DC

BS ISO 25387 Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope

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23.20 EUR
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23.20 EUR
Standard number:25/30505052 DC
Pages:60
Released:2025-07-18
Status:Draft for Comment
Pages (English):60
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25/30505052 DC


This standard 25/30505052 DC BS ISO 25387 Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope is classified in these ICS categories:
  • 37.020 Optical equipment

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