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>BSI Standards >31 ELECTRONICS>31.080 Semiconductor devices>31.080.30 Transistors>25/30531418 DC BS IEC 63673 Guidelines for Gate Charge (QG) test method for SIC MOSFET
immediate downloadReleased: 2025-09-05
25/30531418 DC BS IEC 63673 Guidelines for Gate Charge (QG) test method for SIC MOSFET

25/30531418 DC

BS IEC 63673 Guidelines for Gate Charge (QG) test method for SIC MOSFET

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22.40 EUR
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Standard number:25/30531418 DC
Pages:12
Released:2025-09-05
Status:Draft for Comment
DESCRIPTION

25/30531418 DC


This standard 25/30531418 DC BS IEC 63673 Guidelines for Gate Charge (QG) test method for SIC MOSFET is classified in these ICS categories:
  • 31.080.30 Transistors

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