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>BSI Standards >31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>BS 3494-2:1966 Recommendations on semiconductors devices. Methods of measurement of the characteristics of diaode and transistors
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immediate downloadReleased: 1966-02-28
BS 3494-2:1966 Recommendations on semiconductors devices. Methods of measurement of the characteristics of diaode and transistors

BS 3494-2:1966

Recommendations on semiconductors devices. Methods of measurement of the characteristics of diaode and transistors

CURRENCY
249.6 EUR
Standard number:BS 3494-2:1966
Released:1966-02-28
Status:Standard
DESCRIPTION

BS 3494-2:1966


This standard BS 3494-2:1966 Recommendations on semiconductors devices. Methods of measurement of the characteristics of diaode and transistors is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

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