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>BSI Standards >31 ELECTRONICS>31.140 Piezoelectric and dielectric devices>BS EN 60444-2:1997 Measurement of quartz crystal unit parameters Phase offset method for measurement of motional capacitance of quartz crystal units
immediate downloadReleased: 1993-09-15
BS EN 60444-2:1997 Measurement of quartz crystal unit parameters Phase offset method for measurement of motional capacitance of quartz crystal units

BS EN 60444-2:1997

Measurement of quartz crystal unit parameters Phase offset method for measurement of motional capacitance of quartz crystal units

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Standard number:BS EN 60444-2:1997
Pages:16
Released:1993-09-15
ISBN:0 580 22497 X
Status:Standard
DESCRIPTION

BS EN 60444-2:1997


This standard BS EN 60444-2:1997 Measurement of quartz crystal unit parameters is classified in these ICS categories:
  • 31.140 Piezoelectric devices

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