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>BSI Standards >31 ELECTRONICS>31.200 Integrated circuits. Microelectronics>BS EN 62132-2:2011 Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. TEM cell and wideband TEM cell method
immediate downloadReleased: 2011-04-30
BS EN 62132-2:2011 Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. TEM cell and wideband TEM cell method

BS EN 62132-2:2011

Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. TEM cell and wideband TEM cell method

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Standard number:BS EN 62132-2:2011
Pages:28
Released:2011-04-30
ISBN:978 0 580 57114 5
Status:Standard
DESCRIPTION

BS EN 62132-2:2011


This standard BS EN 62132-2:2011 Integrated circuits. Measurement of electromagnetic immunity is classified in these ICS categories:
  • 31.200 Integrated circuits. Microelectronics

This International Standard specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the characteristics of the TEM cell.


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