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>BSI Standards >31 ELECTRONICS>31.200 Integrated circuits. Microelectronics>BS EN 62132-8:2012 Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. IC stripline method
immediate downloadReleased: 2012-10-31
BS EN 62132-8:2012 Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. IC stripline method

BS EN 62132-8:2012

Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. IC stripline method

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Standard number:BS EN 62132-8:2012
Pages:26
Released:2012-10-31
ISBN:978 0 580 64866 3
Status:Standard
DESCRIPTION

BS EN 62132-8:2012


This standard BS EN 62132-8:2012 Integrated circuits. Measurement of electromagnetic immunity is classified in these ICS categories:
  • 31.200 Integrated circuits. Microelectronics
IEC 62132-8:2012 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances over the frequency range of 150 kHz to 3 GHz.

This publication is to be read in conjunction with IEC 62132-1:2006.
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