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>BSI Standards >31 ELECTRONICS>31.080 Semiconductor devices>31.080.30 Transistors>BS EN 62373:2006 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
immediate downloadReleased: 2006-09-29
BS EN 62373:2006 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

BS EN 62373:2006

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

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Standard number:BS EN 62373:2006
Pages:16
Released:2006-09-29
ISBN:0 580 49255 9
Status:Standard
DESCRIPTION

BS EN 62373:2006


This standard BS EN 62373:2006 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) is classified in these ICS categories:
  • 31.080.30 Transistors
Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)
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