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>BSI Standards >29 ELECTRICAL ENGINEERING>29.140 Lamps and related equipment>29.140.99 Other standards related to lamps>BS EN IEC 60749-21:2026 - TC Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Solderability
immediate downloadReleased: 2026-02-12
BS EN IEC 60749-21:2026 - TC Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Solderability

BS EN IEC 60749-21:2026 - TC

Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Solderability

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Standard number:BS EN IEC 60749-21:2026 - TC
Pages:64
Released:2026-02-12
ISBN:978 0 539 41126 3
Status:Tracked Changes
DESCRIPTION

BS EN IEC 60749-21:2026 - TC


This standard BS EN IEC 60749-21:2026 - TC Tracked Changes. Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general
  • 29.140.99 Other standards related to lamps

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