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Homepage>BS Standards>33 TELECOMMUNICATIONS. AUDIO AND VIDEO ENGINEERING>33.100 Electromagnetic compatibility (EMC)>33.100.01 Electromagnetic compatibility in general>BS EN IEC 62153-4-15:2021 Metallic cables and other passive components test methods Electromagnetic compatibility (EMC). Test method for measuring transfer impedance and screening attenuation. or coupling attenuation with triaxial cell
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BS EN IEC 62153-4-15:2021 Metallic cables and other passive components test methods Electromagnetic compatibility (EMC). Test method for measuring transfer impedance and screening attenuation. or coupling attenuation with triaxial cell

BS EN IEC 62153-4-15:2021

Metallic cables and other passive components test methods Electromagnetic compatibility (EMC). Test method for measuring transfer impedance and screening attenuation. or coupling attenuation with triaxial cell

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Standard number:BS EN IEC 62153-4-15:2021
Pages:50
Released:2021-09-21
ISBN:978 0 539 02846 1
Status:Standard
DESCRIPTION

BS EN IEC 62153-4-15:2021


This standard BS EN IEC 62153-4-15:2021 Metallic cables and other passive components test methods is classified in these ICS categories:
  • 33.100.10 Emission
  • 33.120.10 Coaxial cables. Waveguides
  • 33.100.01 Electromagnetic compatibility in general
IEC 62153-4-15:2021 is available as IEC 62153-4-15:2021 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC 62153-4-15:2021 specifies the procedures for measuring with triaxial cell the transfer impedance, screening attenuation or the coupling attenuation of connectors, cable assemblies and components, for example accessories for analogue and digital transmission systems, and equipment for communication networks and cabling. This second edition cancels and replaces the first edition published in 2015.This edition includes the following significant technical changes with respect to the previous edition: a) measurement of coupling attenuation of balanced connectors, assemblies and components with balun and balunless added; b) application of a test adapter was added; c) application of a moveable shorting plane; d) application of the triaxial "absorber" cell; e) correction of test results in the case that the receiver input impedance R is higher than the characteristic impedance of the outer circuit Z2.