BS EN IEC 63185:2025

Measurement of the Complex Permittivity for Low-Loss Dielectric Substrates Using the Balanced-Type Circular Disk Resonator Method

Introducing the BS EN IEC 63185:2025, a comprehensive standard that provides a detailed methodology for measuring the complex permittivity of low-loss dielectric substrates. This standard is essential for professionals and researchers working in the field of electronics and materials science, offering a precise and reliable method to evaluate dielectric materials.

Key Features:

• Standard Number: BS EN IEC 63185:2025
• Pages: 18
• Release Date: May 7, 2025
• ISBN: 978 0 539 23559 3
• Status: Standard

Overview:

This standard outlines the balanced-type circular disk resonator method, a sophisticated technique used to measure the complex permittivity of dielectric substrates. This method is particularly beneficial for substrates that exhibit low-loss characteristics, ensuring high accuracy and reliability in measurements.

Why Choose This Standard?

The BS EN IEC 63185:2025 standard is designed to meet the needs of modern electronic applications where precise material characterization is crucial. By adhering to this standard, you can ensure that your measurements are consistent, repeatable, and in line with international best practices.

Applications:

This standard is applicable in various fields, including:

• Telecommunications
• Consumer electronics
• Automotive electronics
• Medical devices
• Research and development in material science

Benefits:

Adopting the BS EN IEC 63185:2025 standard offers numerous benefits, such as:

• Enhanced Accuracy: Provides a precise method for measuring complex permittivity, crucial for high-performance applications.
• International Recognition: As an IEC standard, it is recognized globally, facilitating international collaboration and trade.
• Improved Product Development: Helps in the development of advanced materials and products by providing reliable data on material properties.
• Cost Efficiency: Reduces the need for repeated testing by providing a standardized approach.

Technical Details:

The balanced-type circular disk resonator method described in this standard is a non-destructive testing technique that allows for the accurate determination of both the real and imaginary parts of the permittivity. This is particularly important for applications where dielectric losses need to be minimized.

Who Should Use This Standard?

This standard is ideal for:

• Engineers and technicians involved in material testing and characterization
• Researchers in the field of electronics and materials science
• Quality assurance professionals in manufacturing industries
• Academics and students studying advanced materials

Conclusion:

The BS EN IEC 63185:2025 is an indispensable resource for anyone involved in the measurement and analysis of dielectric materials. By providing a clear and standardized method for measuring complex permittivity, it ensures that your results are accurate, reliable, and internationally recognized. Whether you are in research, development, or quality assurance, this standard will help you achieve the highest levels of precision and efficiency in your work.

BS EN IEC 63185:2025

This standard BS EN IEC 63185:2025 Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method is classified in these ICS categories:

• 33.120.30 RF connectors

IEC 63185:2025 relates to a measurement method for complex permittivity of dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes and that of fringing fields are taken into account accurately on the basis of the mode-matching analysis. This second edition cancels and replaces the first edition published in 2020. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) the upper limit of the applicable frequency range has been extended from 110 GHz to 170 GHz; b) circular disk resonators used for the measurements now include one with waveguide interfaces; c) in calculating the complex permittivity from the measured resonant properties, the fringing fields are now accurately taken into account based on the mode-matching analysis.