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>BSI Standards >31 ELECTRONICS>31.260 Optoelectronics. Laser equipment>BS EN ISO 14880-2:2024 - TC Tracked Changes. Optics and photonics. Microlens arrays Test methods for wavefront aberrations
immediate downloadReleased: 2024-12-02
BS EN ISO 14880-2:2024 - TC Tracked Changes. Optics and photonics. Microlens arrays Test methods for wavefront aberrations

BS EN ISO 14880-2:2024 - TC

Tracked Changes. Optics and photonics. Microlens arrays Test methods for wavefront aberrations

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Standard number:BS EN ISO 14880-2:2024 - TC
Pages:84
Released:2024-12-02
ISBN:978 0 539 34491 2
Status:Tracked Changes
DESCRIPTION

BS EN ISO 14880-2:2024 - TC


This standard BS EN ISO 14880-2:2024 - TC Tracked Changes. Optics and photonics. Microlens arrays is classified in these ICS categories:
  • 31.260 Optoelectronics. Laser equipment
This document specifies methods for testing wavefront aberrations for microlenses within microlens arrays. It is applicable to microlens arrays with very small lenses formed inside or on one or more surfaces of a common substrate.
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