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>BSI Standards >07 MATHEMATICS. NATURAL SCIENCES>07.030 Physics. Chemistry>BS IEC 62860:2013 Test methods for the characterization of organic transistors and materials
immediate downloadReleased: 2014-08-31
BS IEC 62860:2013 Test methods for the characterization of organic transistors and materials

BS IEC 62860:2013

Test methods for the characterization of organic transistors and materials

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Standard number:BS IEC 62860:2013
Pages:28
Released:2014-08-31
ISBN:978 0 580 82727 3
Status:Standard
DESCRIPTION

BS IEC 62860:2013


This standard BS IEC 62860:2013 Test methods for the characterization of organic transistors and materials is classified in these ICS categories:
  • 07.120 Nanotechnologies
  • 07.030 Physics. Chemistry

This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.


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