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>BSI Standards >31 ELECTRONICS>31.080 Semiconductor devices>31.080.99 Other semiconductor devices>BS IEC 62951-3:2018 Semiconductor devices. Flexible and stretchable semiconductor devices Evaluation of thin film transistor characteristics on flexible substrates under bulging
immediate downloadReleased: 2018-11-15
BS IEC 62951-3:2018 Semiconductor devices. Flexible and stretchable semiconductor devices Evaluation of thin film transistor characteristics on flexible substrates under bulging

BS IEC 62951-3:2018

Semiconductor devices. Flexible and stretchable semiconductor devices Evaluation of thin film transistor characteristics on flexible substrates under bulging

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Standard number:BS IEC 62951-3:2018
Pages:26
Released:2018-11-15
ISBN:978 0 580 97278 2
Status:Standard
DESCRIPTION

BS IEC 62951-3:2018


This standard BS IEC 62951-3:2018 Semiconductor devices. Flexible and stretchable semiconductor devices is classified in these ICS categories:
  • 31.080.99 Other semiconductor devices
IEC 62951-3:2018(E) specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates, including polyethylene terephthalate (PET), polyimide (PI), elastomer and others. The stress is applied by applying a uniformly-distributed pressure to the flexible substrate using the equipment.
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