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>BSI Standards >37 IMAGE TECHNOLOGY>37.020 Optical equipment>BS ISO 16700:2016 - TC Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
immediate downloadReleased: 2020-02-26
BS ISO 16700:2016 - TC Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

BS ISO 16700:2016 - TC

Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

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365.12 EUR
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Standard number:BS ISO 16700:2016 - TC
Pages:58
Released:2020-02-26
ISBN:978 0 539 10715 9
Status:Tracked Changes
DESCRIPTION

BS ISO 16700:2016 - TC


This standard BS ISO 16700:2016 - TC Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification is classified in these ICS categories:
  • 37.020 Optical equipment

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