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immediate downloadReleased: 2014-01-31
BS ISO 17470:2014
Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
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| Standard number: | BS ISO 17470:2014 |
| Pages: | 22 |
| Released: | 2014-01-31 |
| ISBN: | 978 0 580 84121 7 |
| Status: | Standard |
| Pages (English): | 22 |
| ISBN (English): | 978 0 580 84121 7 |
DESCRIPTION
BS ISO 17470:2014
This standard BS ISO 17470:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry is classified in these ICS categories:
- 71.040.99 Other standards related to analytical chemistry
This International Standard gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.