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Homepage>BS Standards>71 CHEMICAL TECHNOLOGY>71.040 Analytical chemistry>71.040.99 Other standards related to analytical chemistry>BS ISO 17470:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
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immediate downloadReleased: 2014-01-31
BS ISO 17470:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

BS ISO 17470:2014

Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

CURRENCY
LANGUAGE
English
Standard number:BS ISO 17470:2014
Pages:22
Released:2014-01-31
ISBN:978 0 580 84121 7
Status:Standard
DESCRIPTION
This standard BS ISO 17470:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry is classified in these ICS categories:
  • 71.040.99 Other standards related to analytical chemistry

This product includes: