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Homepage>BS Standards>37 IMAGE TECHNOLOGY>37.020 Optical equipment>BS ISO 20263:2017 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
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immediate downloadReleased: 2018-01-04
BS ISO 20263:2017 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials

BS ISO 20263:2017

Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials

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Standard number:BS ISO 20263:2017
Pages:54
Released:2018-01-04
ISBN:978 0 580 89345 2
Status:Standard
DESCRIPTION

BS ISO 20263:2017


This standard BS ISO 20263:2017 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials is classified in these ICS categories:
  • 37.020 Optical equipment
  • 71.040.50 Physicochemical methods of analysis