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31.140 Piezoelectric and dielectric devices
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18/30383935 DC
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
Released: 2018-12-04
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BS EN 168101:1997
Harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal units (capability approval)
Harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal units (capability approval)
Released: 1990-12-31
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BS EN 60862-3:2003
Surface acoustic wave (SAW) filters of assessed quality Standard outlines
Surface acoustic wave (SAW) filters of assessed quality Standard outlines
Released: 2004-02-16
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BS EN 60444-6:2013
Measurement of quartz crystal unit parameters Measurement of drive level dependence (DLD)
Measurement of quartz crystal unit parameters Measurement of drive level dependence (DLD)
Released: 2013-10-31
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BS EN 60368-3:2010
Piezoelectric filters of assessed quality Standard outlines and lead connections
Piezoelectric filters of assessed quality Standard outlines and lead connections
Released: 2011-02-28
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BS EN 61019-1:2005
Surface acoustic wave (SAW) resonators Generic specification
Surface acoustic wave (SAW) resonators Generic specification
Released: 2005-03-10
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