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Homepage>BS Standards>31 ELECTRONICS>31.140 Piezoelectric and dielectric devices>BS EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guidelines
immediate downloadReleased: 2011-06-30
BS EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guidelines

BS EN 60679-6:2011

Quartz crystal controlled oscillators of assessed quality Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guidelines

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Standard number:BS EN 60679-6:2011
Pages:26
Released:2011-06-30
ISBN:978 0 580 64877 9
Status:Standard
DESCRIPTION

BS EN 60679-6:2011


This standard BS EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality is classified in these ICS categories:
  • 31.140 Piezoelectric devices

This part of the IEC 60679 series applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter.

In the measurement method, phase noise measurement equipment or a phase noise measurement system is used.

The measuring frequency range is from 10 MHz to1 000 MHz.

This standard applies to quartz crystal oscillators and SAW oscillators used in electronic devices and modules that have the multiplication or division functions based on these oscillators. The type of phase jitter applied to these oscillators is the r.m.s. jitter. In the following text, these oscillators and modules will be referred to as “oscillator(s)” for simplicity.