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Homepage>CSN Standards>35 ELECTRICAL ENGINEERING>3587 Semiconductor elements>CSN EN IEC 60749-5 ed. 3 - Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Released: 01.07.2024
CSN EN IEC 60749-5 ed. 3 - Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

CSN EN IEC 60749-5 ed. 3

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

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Number of Standard:CSN EN IEC 60749-5 ed. 3
Category:358799
Pages:20
Released:01.07.2024
Catalog number:519006
DESCRIPTION

CSN EN IEC 60749-5 ed. 3

CSN EN IEC 60749-5 ed. 3 Tato norma poskytuje zkoušku životnosti konstantní teplotou a vlhkostí při elektrické polarizaci za účelem vyhodnocení spolehlivosti nehermeticky zapouzdřených polovodičových součástek ve vlhkém prostředí. Tato zkouška je považována za destruktivní.
Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.
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