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CSN EN IEC 60749-5 ed. 3
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Released: 01.07.2024
English Hardcopy
In stock
82.35 USD
CSN EN 62433-4
EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)
EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)
Released: 01.01.2017
English Hardcopy
In stock
200.00 USD
English Hardcopy
In stock
94.12 USD
CSN EN 62435-2
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms
Released: 01.09.2017
English Hardcopy
In stock
111.76 USD
CSN EN IEC 60749-13 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Released: 01.10.2018
English Hardcopy
In stock
94.12 USD
English Hardcopy
In stock
82.35 USD
CSN EN 62132-1 ed. 2
Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
Released: 01.06.2016
English Hardcopy
In stock
129.41 USD
CSN EN IEC 61967-4 ed. 2
Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 Ů/150 Ů direct coupling method
Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 Ů/150 Ů direct coupling method
Released: 01.10.2021
English Hardcopy
In stock
147.06 USD
CSN EN IEC 63287-1
Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
Released: 01.04.2022
English Hardcopy
In stock
147.06 USD
English Hardcopy
In stock
94.12 USD
CSN EN 60749-7 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Released: 01.02.2012
English Hardcopy
In stock
82.35 USD
CSN EN 61988-2-5
Plasma display panels - Part 2-5: Measuring methods - Acoustic noise
Plasma display panels - Part 2-5: Measuring methods - Acoustic noise
Released: 01.01.2013
English Hardcopy
In stock
94.12 USD