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CSN EN 62373
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Released: 01.03.2007
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111.76 USD
CSN EN 62258-5
Semiconductor die products - Part 5: Requirements for information concerning electrical simulation
Semiconductor die products - Part 5: Requirements for information concerning electrical simulation
Released: 01.06.2007
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94.12 USD
CSN EN 62374
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films
Released: 01.05.2008
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129.41 USD
CSN EN 62341-1-1
Organic light emitting diode (OLED) displays - Part 1-1: Generic specifications
Organic light emitting diode (OLED) displays - Part 1-1: Generic specifications
Released: 01.05.2010
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111.76 USD
English Hardcopy
In stock
49.41 USD
English Hardcopy
In stock
35.29 USD
English Hardcopy
In stock
49.41 USD
CSN EN 61967-6
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
Released: 01.05.2003
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49.41 USD
CSN EN 60749-25
Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
Released: 01.06.2004
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111.76 USD
CSN IEC 191-2
Mechanical standardization of semiconductor devices - Part 2: Dimensions
Mechanical standardization of semiconductor devices - Part 2: Dimensions
Released: 01.01.2000
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35.29 USD
CSN EN IEC 60747-16-8
Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
Released: 01.07.2023
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129.41 USD
CSN EN 62779-2
Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
Released: 01.10.2016
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94.12 USD