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CSN EN 60191-6-16
Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA
Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA
Released: 01.01.2008
English Hardcopy
In stock
61.18 USD
CSN EN 62047-19
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
Released: 01.04.2014
English Hardcopy
In stock
98.82 USD
English Hardcopy
In stock
81.18 USD
CSN EN 62047-22
Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates
Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates
Released: 01.04.2015
English Hardcopy
In stock
71.76 USD
CSN EN 60749-42
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
Released: 01.04.2015
English Hardcopy
In stock
61.18 USD
CSN EN 62047-17
Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films
Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films
Released: 01.09.2015
English Hardcopy
In stock
81.18 USD
CSN EN 62415
Semiconductor devices - Constant current electromigration test (IEC 62415:2010)
Semiconductor devices - Constant current electromigration test (IEC 62415:2010)
Released: 01.12.2010
English Hardcopy
In stock
61.18 USD
CSN EN 62779-1
Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
Released: 01.10.2016
English Hardcopy
In stock
81.18 USD
CSN EN IEC 61967-8 ed. 2
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Released: 01.12.2023
English Hardcopy
In stock
71.76 USD
CSN EN 60749-8
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
Released: 01.12.2003
English Hardcopy
In stock
98.82 USD
CSN EN 60749-22
Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength
Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength
Released: 01.12.2003
English Hardcopy
In stock
98.82 USD
CSN EN 61967-2
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
Released: 01.04.2006
English Hardcopy
In stock
108.24 USD