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CSN EN 60749-42
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
Released: 2014
English Hardcopy
In stock
45.88 USD
English Hardcopy
In stock
80.00 USD
English Hardcopy
In stock
64.71 USD
English Hardcopy
In stock
45.88 USD
CSN EN 60749-6 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
Released: 2017
English Hardcopy
In stock
45.88 USD
English Hardcopy
In stock
45.88 USD
CSN EN 60749-8
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
Released: 2003
English Hardcopy
In stock
80.00 USD
CSN EN 60749-9 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
Released: 2017
English Hardcopy
In stock
45.88 USD
CSN EN 61747-10-1
Liquid crystal display devices - Part 10-1: Environmental, endurance and mechanical test methods - Mechanical
Liquid crystal display devices - Part 10-1: Environmental, endurance and mechanical test methods - Mechanical
Released: 2013
English Hardcopy
In stock
57.65 USD
English Hardcopy
In stock
57.65 USD
CSN EN 61747-2-2
Liquid crystal display devices - Part 2-2: Matrix colour LCD modules - Blank detail specification
Liquid crystal display devices - Part 2-2: Matrix colour LCD modules - Blank detail specification
Released: 2004
English Hardcopy
In stock
64.71 USD
CSN EN 61747-3 ed. 2
Liquid crystal display devices - Part 3: Liquid crystal display (LCD) cells - Sectional specification
Liquid crystal display devices - Part 3: Liquid crystal display (LCD) cells - Sectional specification
Released: 2006
English Hardcopy
In stock
80.00 USD