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CSN IEC 62880-1
Semiconductor devices - Stress migration test standard - Part 1: Copper stress migration test standard
Semiconductor devices - Stress migration test standard - Part 1: Copper stress migration test standard
Released: 01.06.2018
English Hardcopy
In stock
111.76 USD
CSN EN 60749-8
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
Released: 01.12.2003
English Hardcopy
In stock
129.41 USD
CSN EN 60749-22
Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength
Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength
Released: 01.12.2003
English Hardcopy
In stock
129.41 USD
CSN EN IEC 62435-8
Electronic components - Long-term storage of electronic semiconductor devices - Part 8: Passive electronic devices
Electronic components - Long-term storage of electronic semiconductor devices - Part 8: Passive electronic devices
Released: 01.03.2021
English Hardcopy
In stock
94.12 USD
CSN EN IEC 63244-1
Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications
Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications
Released: 01.05.2022
English Hardcopy
In stock
129.41 USD
CSN EN IEC 62228-7
Integrated circuits - EMC evaluation of transceivers - Part 7: CXPI transceivers
Integrated circuits - EMC evaluation of transceivers - Part 7: CXPI transceivers
Released: 01.10.2022
English Hardcopy
In stock
147.06 USD
CSN EN IEC 60749-10 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly
Released: 01.01.2023
English Hardcopy
In stock
94.12 USD
CSN EN IEC 61967-8 ed. 2
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Released: 01.12.2023
English Hardcopy
In stock
94.12 USD
CSN EN IEC 60749-7 ed. 3
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Released: 01.06.2026
English Hardcopy
In stock
94.12 USD
CSN EN 61747-4-1
Liquid crystal display devices - Part 4-1: Matrix colour LCD modules - Essential ratings and characteristics
Liquid crystal display devices - Part 4-1: Matrix colour LCD modules - Essential ratings and characteristics
Released: 01.06.2005
English Hardcopy
In stock
94.12 USD
CSN EN 60749-35
Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
Released: 01.05.2007
English Hardcopy
In stock
147.06 USD