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CSN EN 60749-35
Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
Released: 01.05.2007
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102.22 USD
CSN EN 60749-36
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
Released: 01.12.2003
English Hardcopy
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57.78 USD
CSN EN 60749-37
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Released: 01.09.2008
English Hardcopy
In stock
76.67 USD
CSN EN 60749-38
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
Released: 01.10.2008
English Hardcopy
In stock
57.78 USD
English Hardcopy
In stock
67.78 USD
CSN EN 60749-4 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Released: 01.10.2017
English Hardcopy
In stock
57.78 USD
CSN EN 60749-40
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge
Released: 01.03.2012
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In stock
76.67 USD
CSN EN 60749-42
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
Released: 01.04.2015
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In stock
57.78 USD
CSN EN 60749-44
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Released: 01.02.2017
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76.67 USD
CSN EN 60749-5 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Released: 01.12.2017
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In stock
57.78 USD
CSN EN 60749-6 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
Released: 01.10.2017
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In stock
57.78 USD
CSN EN 60749-7 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Released: 01.02.2012
English Hardcopy
In stock
57.78 USD