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CSN EN IEC 60747-16-8
Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
Released: 01.07.2023
English Hardcopy
In stock
98.82 USD
CSN EN IEC 63287-2
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
Released: 01.12.2023
English Hardcopy
In stock
71.76 USD
CSN EN IEC 62433-6
EMC IC modelling - Part 6: Models of integrated circuits for Pulse immunity behavioural simulation - Conducted Pulse Immunity (ICIM-CPI)
EMC IC modelling - Part 6: Models of integrated circuits for Pulse immunity behavioural simulation - Conducted Pulse Immunity (ICIM-CPI)
Released: 01.04.2021
English Hardcopy
In stock
115.29 USD
English Hardcopy
In stock
98.82 USD
CSN EN IEC 61967-4 ed. 2
Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 Ů/150 Ů direct coupling method
Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 Ů/150 Ů direct coupling method
Released: 01.10.2021
English Hardcopy
In stock
108.24 USD
CSN EN 62435-2
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms
Released: 01.09.2017
English Hardcopy
In stock
81.18 USD
CSN EN IEC 60749-13 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Released: 01.10.2018
English Hardcopy
In stock
71.76 USD
CSN EN 62415
Semiconductor devices - Constant current electromigration test (IEC 62415:2010)
Semiconductor devices - Constant current electromigration test (IEC 62415:2010)
Released: 01.12.2010
English Hardcopy
In stock
61.18 USD
CSN EN 62047-8
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films
Released: 01.12.2011
English Hardcopy
In stock
71.76 USD
CSN EN 60749-21 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
Released: 01.12.2011
English Hardcopy
In stock
81.18 USD
CSN EN 62047-7
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
Released: 01.02.2012
English Hardcopy
In stock
81.18 USD
CSN EN 61747-6-2
Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type
Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type
Released: 01.03.2012
English Hardcopy
In stock
115.29 USD