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CSN EN 62373
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Released: 01.03.2007
English Hardcopy
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111.76 USD
CSN EN 62258-5
Semiconductor die products - Part 5: Requirements for information concerning electrical simulation
Semiconductor die products - Part 5: Requirements for information concerning electrical simulation
Released: 01.06.2007
English Hardcopy
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94.12 USD
CSN EN 62374
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films
Released: 01.05.2008
English Hardcopy
In stock
129.41 USD
CSN EN 62341-1-1
Organic light emitting diode (OLED) displays - Part 1-1: Generic specifications
Organic light emitting diode (OLED) displays - Part 1-1: Generic specifications
Released: 01.05.2010
English Hardcopy
In stock
111.76 USD
CSN EN 62416
Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010)
Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010)
Released: 01.12.2010
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82.35 USD
CSN EN 61747-5-3
Liquid crystal display devices - Part 5-3: Environmental, endurance and mechanical test methods - Glass strength and reliability
Liquid crystal display devices - Part 5-3: Environmental, endurance and mechanical test methods - Glass strength and reliability
Released: 01.12.2010
English Hardcopy
In stock
111.76 USD
English Hardcopy
In stock
111.76 USD
CSN EN 62374-1
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Released: 01.07.2011
English Hardcopy
In stock
94.12 USD
English Hardcopy
In stock
49.41 USD
English Hardcopy
In stock
35.29 USD
English Hardcopy
In stock
49.41 USD
CSN EN IEC 63287-2
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
Released: 01.12.2023
English Hardcopy
In stock
94.12 USD