PRICES include / exclude VAT
3587 Semiconductor elements
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
CSN EN 60749-22
Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength
Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength
Released: 01.12.2003
English Hardcopy
In stock
93.33 USD
CSN EN 60749-23
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Released: 01.12.2004
English Hardcopy
In stock
67.78 USD
CSN EN 60749-24
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
Released: 01.12.2004
English Hardcopy
In stock
57.78 USD
CSN EN 60749-25
Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
Released: 01.06.2004
English Hardcopy
In stock
76.67 USD
CSN EN 60749-27
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Released: 01.03.2007
English Hardcopy
In stock
76.67 USD
CSN EN 60749-28
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
Released: 01.12.2017
English Hardcopy
In stock
102.22 USD
CSN EN 60749-29 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Released: 01.12.2011
English Hardcopy
In stock
76.67 USD
CSN EN 60749-3 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
Released: 01.10.2017
English Hardcopy
In stock
57.78 USD
CSN EN 60749-31
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
Released: 01.12.2003
English Hardcopy
In stock
57.78 USD
CSN EN 60749-32
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (exterrnally induced)
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (exterrnally induced)
Released: 01.12.2003
English Hardcopy
In stock
57.78 USD
CSN EN 60749-33
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
Released: 01.12.2004
English Hardcopy
In stock
57.78 USD
CSN EN 60749-34 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Released: 01.09.2011
English Hardcopy
In stock
67.78 USD