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English Hardcopy
In stock
94.12 USD
CSN EN IEC 62433-6
EMC IC modelling - Part 6: Models of integrated circuits for Pulse immunity behavioural simulation - Conducted Pulse Immunity (ICIM-CPI)
EMC IC modelling - Part 6: Models of integrated circuits for Pulse immunity behavioural simulation - Conducted Pulse Immunity (ICIM-CPI)
Released: 01.04.2021
English Hardcopy
In stock
158.82 USD
English Hardcopy
In stock
129.41 USD
CSN EN IEC 60749-13 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Released: 01.10.2018
English Hardcopy
In stock
94.12 USD
CSN EN IEC 63287-2
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
Released: 01.12.2023
English Hardcopy
In stock
94.12 USD
CSN EN 62416
Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010)
Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010)
Released: 01.12.2010
English Hardcopy
In stock
82.35 USD
CSN EN 61747-5-3
Liquid crystal display devices - Part 5-3: Environmental, endurance and mechanical test methods - Glass strength and reliability
Liquid crystal display devices - Part 5-3: Environmental, endurance and mechanical test methods - Glass strength and reliability
Released: 01.12.2010
English Hardcopy
In stock
111.76 USD
English Hardcopy
In stock
111.76 USD
CSN EN 62374-1
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Released: 01.07.2011
English Hardcopy
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94.12 USD
CSN EN 60749-7 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Released: 01.02.2012
English Hardcopy
In stock
82.35 USD
CSN EN IEC 60749-5 ed. 3
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Released: 01.07.2024
English Hardcopy
In stock
82.35 USD
CSN EN IEC 63378-3
Thermal standardization on semiconductor packages - Part 3: Thermal circuit simulation models of discrete semiconductor packages for transient analysis
Thermal standardization on semiconductor packages - Part 3: Thermal circuit simulation models of discrete semiconductor packages for transient analysis
Released: 01.12.2025
English Hardcopy
In stock
94.12 USD