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CSN EN 60749-1
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Released: 01.12.2003
English Hardcopy
In stock
94.12 USD
CSN EN 60749-19
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
Released: 01.12.2003
English Hardcopy
In stock
82.35 USD
English Hardcopy
In stock
82.35 USD
CSN EN 61747-4-1
Liquid crystal display devices - Part 4-1: Matrix colour LCD modules - Essential ratings and characteristics
Liquid crystal display devices - Part 4-1: Matrix colour LCD modules - Essential ratings and characteristics
Released: 01.06.2005
English Hardcopy
In stock
94.12 USD
CSN EN 61988-3-2
Plasma display panels - Part 3-2: Interface - Electrical interface
Plasma display panels - Part 3-2: Interface - Electrical interface
Released: 01.04.2010
English Hardcopy
In stock
111.76 USD
CSN EN 61988-5
Plasma display panels - Part 5: Generic specification
Plasma display panels - Part 5: Generic specification
Released: 01.06.2010
English Hardcopy
In stock
111.76 USD
English Hardcopy
In stock
129.41 USD
CSN EN 60749-34 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Released: 01.09.2011
English Hardcopy
In stock
94.12 USD
CSN EN 60749-29 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Released: 01.12.2011
English Hardcopy
In stock
111.76 USD
English Hardcopy
In stock
49.41 USD
CSN EN 60747-16-3
Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
Released: 01.02.2003
English Hardcopy
In stock
49.41 USD
CSN EN 60749-2
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
Released: 01.04.2003
English Hardcopy
In stock
49.41 USD