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CSN EN IEC 60749-26 ed. 3
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
Released: 01.08.2018
English Hardcopy
In stock
115.29 USD
CSN EN 62047-26
Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures
Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures
Released: 01.08.2016
English Hardcopy
In stock
98.82 USD
CSN EN 60749-44
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Released: 01.02.2017
English Hardcopy
In stock
81.18 USD
English Hardcopy
In stock
98.82 USD
CSN EN 62258-2 ed. 2
Semiconductor die products - Part 2: Exchange data formats
Semiconductor die products - Part 2: Exchange data formats
Released: 01.01.2012
English Hardcopy
In stock
124.71 USD
CSN EN 62047-10
Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials
Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials
Released: 01.03.2012
English Hardcopy
In stock
71.76 USD
CSN EN 62047-14
Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials
Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials
Released: 01.10.2012
English Hardcopy
In stock
71.76 USD
English Hardcopy
In stock
71.76 USD
CSN EN 60749-27
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Released: 01.03.2007
English Hardcopy
In stock
81.18 USD
CSN EN 62047-3
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
Released: 01.05.2007
English Hardcopy
In stock
71.76 USD
CSN EN 60749-38
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
Released: 01.10.2008
English Hardcopy
In stock
61.18 USD
CSN EN 60749-16
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
Released: 01.11.2003
English Hardcopy
In stock
61.18 USD