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3587 Semiconductor elements
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CSN EN 60747-16-5
Semiconductor devices - Part 16- 5: Microwave integrated circuits - Oscillators
Semiconductor devices - Part 16- 5: Microwave integrated circuits - Oscillators
Released: 01.03.2014
English Hardcopy
In stock
147.06 USD
CSN EN IEC 60747-17
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
Released: 01.04.2021
English Hardcopy
In stock
158.82 USD
CSN EN IEC 62228-5
Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers
Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers
Released: 01.12.2021
English Hardcopy
In stock
200.00 USD
CSN EN IEC 62435-9
Electronic components - Long-term storage of electronic semiconductor devices - Part 9: Special cases
Electronic components - Long-term storage of electronic semiconductor devices - Part 9: Special cases
Released: 01.04.2022
English Hardcopy
In stock
94.12 USD
CSN EN 62047-21
Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials
Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials
Released: 01.04.2015
English Hardcopy
In stock
94.12 USD
CSN EN 62047-20
Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
Released: 01.04.2015
English Hardcopy
In stock
158.82 USD
CSN EN 62047-26
Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures
Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures
Released: 01.08.2016
English Hardcopy
In stock
129.41 USD
CSN EN 60749-44
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Released: 01.02.2017
English Hardcopy
In stock
111.76 USD
CSN EN IEC 61967-1 ed. 2
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
Released: 01.07.2019
English Hardcopy
In stock
129.41 USD
CSN EN IEC 60747-16-6
Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers
Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers
Released: 01.02.2020
English Hardcopy
In stock
111.76 USD
CSN IEC 60191-5
Mechanical standardization of semiconductor devices - Part 5: Recommendations applying to integrated circuit packages using tape automated bonding (TAB)
Mechanical standardization of semiconductor devices - Part 5: Recommendations applying to integrated circuit packages using tape automated bonding (TAB)
Released: 01.01.2000
English Hardcopy
In stock
35.29 USD
CSN IEC 60191-2W
Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
Released: 01.06.2000
English Hardcopy
In stock
35.29 USD