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CSN EN IEC 60749-12 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
Released: 01.08.2018
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57.78 USD
CSN EN IEC 62435-4
Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage
Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage
Released: 01.01.2019
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76.67 USD
CSN EN IEC 62433-1
EMC IC modelling - Part 1: General modelling framework
EMC IC modelling - Part 1: General modelling framework
Released: 01.11.2019
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117.78 USD
CSN EN IEC 60749-18 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
Released: 01.12.2019
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76.67 USD
CSN EN 62373
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Released: 01.03.2007
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76.67 USD
CSN EN 62258-5
Semiconductor die products - Part 5: Requirements for information concerning electrical simulation
Semiconductor die products - Part 5: Requirements for information concerning electrical simulation
Released: 01.06.2007
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67.78 USD
CSN EN 62374
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films
Released: 01.05.2008
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93.33 USD
CSN EN 60749-37
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Released: 01.09.2008
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76.67 USD
CSN EN 61988-2-5
Plasma display panels - Part 2-5: Measuring methods - Acoustic noise
Plasma display panels - Part 2-5: Measuring methods - Acoustic noise
Released: 01.01.2013
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67.78 USD
CSN EN 61747-4 ed. 2
Liquid crystal display devices - Part 4: Liquid crystal display modules and cells - Essential ratings and characteristics -
Liquid crystal display devices - Part 4: Liquid crystal display modules and cells - Essential ratings and characteristics -
Released: 01.07.2013
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57.78 USD
CSN EN 61747-10-1
Liquid crystal display devices - Part 10-1: Environmental, endurance and mechanical test methods - Mechanical
Liquid crystal display devices - Part 10-1: Environmental, endurance and mechanical test methods - Mechanical
Released: 01.03.2014
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67.78 USD
CSN EN 60191-4 ed. 2
Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
Released: 01.06.2014
English Hardcopy
In stock
76.67 USD