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English Hardcopy
In stock
98.82 USD
CSN EN 60749-34 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Released: 01.09.2011
English Hardcopy
In stock
71.76 USD
CSN EN 60749-29 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Released: 01.12.2011
English Hardcopy
In stock
81.18 USD
CSN EN 62047-9
Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS
Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS
Released: 01.03.2012
English Hardcopy
In stock
81.18 USD
CSN EN 60749-40
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge
Released: 01.03.2012
English Hardcopy
In stock
81.18 USD
CSN EN 61988-2-4
Plasma display panels - Part 2-4: Measuring methods - Visual quality - Image artifacts
Plasma display panels - Part 2-4: Measuring methods - Visual quality - Image artifacts
Released: 01.05.2012
English Hardcopy
In stock
98.82 USD
CSN EN 61747-30-1
Liquid crystal display devices - Part 30-1: Measuring methods for liquid crystal display modules - Transmissive type
Liquid crystal display devices - Part 30-1: Measuring methods for liquid crystal display modules - Transmissive type
Released: 01.03.2013
English Hardcopy
In stock
108.24 USD
CSN EN 62047-18
Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials
Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials
Released: 01.04.2014
English Hardcopy
In stock
71.76 USD
CSN EN 62215-3
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
Released: 01.04.2014
English Hardcopy
In stock
98.82 USD
CSN EN 62433-3
EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)
EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)
Released: 01.09.2017
English Hardcopy
In stock
135.29 USD
CSN EN 60749-3 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
Released: 01.10.2017
English Hardcopy
In stock
61.18 USD
CSN EN 60749-5 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Released: 01.12.2017
English Hardcopy
In stock
61.18 USD