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3587 Semiconductor elements
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English Hardcopy
In stock
67.78 USD
English Hardcopy
In stock
67.78 USD
CSN EN 60747-15 ed. 2
Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
Released: 01.08.2012
English Hardcopy
In stock
76.67 USD
CSN EN 60747-16-10
Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
Released: 01.05.2005
English Hardcopy
In stock
108.89 USD
CSN EN 60747-16-4
Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
Released: 01.05.2005
English Hardcopy
In stock
76.67 USD
CSN EN 60747-16-5
Semiconductor devices - Part 16- 5: Microwave integrated circuits - Oscillators
Semiconductor devices - Part 16- 5: Microwave integrated circuits - Oscillators
Released: 01.03.2014
English Hardcopy
In stock
102.22 USD
CSN EN 60749-1
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Released: 01.12.2003
English Hardcopy
In stock
67.78 USD
CSN EN 60749-14
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
Released: 01.06.2004
English Hardcopy
In stock
76.67 USD
CSN EN 60749-16
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
Released: 01.11.2003
English Hardcopy
In stock
57.78 USD
CSN EN 60749-19
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
Released: 01.12.2003
English Hardcopy
In stock
57.78 USD
English Hardcopy
In stock
93.33 USD
CSN EN 60749-21 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
Released: 01.12.2011
English Hardcopy
In stock
76.67 USD