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Homepage>CSN Standards>35 ELECTRICAL ENGINEERING>3587 Semiconductor elements>CSN EN 62047-6 - Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009)
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Released: 01.11.2010
CSN EN 62047-6 - Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009)

CSN EN 62047-6

Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009)

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Number of Standard:CSN EN 62047-6
Category:358775
Pages:24
Released:01.11.2010
Catalog number:86158
DESCRIPTION

CSN EN 62047-6


Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.
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