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English Hardcopy
In stock
102.22 USD
CSN EN IEC 60749-30 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Released: 01.03.2021
English Hardcopy
In stock
67.78 USD
CSN EN IEC 60749-37 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Released: 01.06.2023
English Hardcopy
In stock
76.67 USD
English Hardcopy
In stock
67.78 USD
CSN EN IEC 60749-41
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
Released: 01.04.2021
English Hardcopy
In stock
76.67 USD
CSN EN IEC 60749-5 ed. 3
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Released: 01.07.2024
English Hardcopy
In stock
57.78 USD
CSN EN IEC 61967-1 ed. 2
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
Released: 01.07.2019
English Hardcopy
In stock
93.33 USD
CSN EN IEC 61967-4 ed. 2
Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 Ů/150 Ů direct coupling method
Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 Ů/150 Ů direct coupling method
Released: 01.10.2021
English Hardcopy
In stock
102.22 USD
CSN EN IEC 61967-8 ed. 2
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Released: 01.12.2023
English Hardcopy
In stock
67.78 USD
CSN EN IEC 62228-1
Integrated Circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions
Integrated Circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions
Released: 01.08.2018
English Hardcopy
In stock
57.78 USD
CSN EN IEC 62228-3
Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers
Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers
Released: 01.11.2019
English Hardcopy
In stock
117.78 USD
CSN EN IEC 62228-5
Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers
Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers
Released: 01.12.2021
English Hardcopy
In stock
144.44 USD