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CSN EN 60749-38
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
Released: 01.10.2008
English Hardcopy
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82.35 USD
CSN EN 60749-16
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
Released: 01.11.2003
English Hardcopy
In stock
82.35 USD
CSN EN 61967-5
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method
Released: 01.12.2003
English Hardcopy
In stock
147.06 USD
CSN EN 60749-32
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (exterrnally induced)
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (exterrnally induced)
Released: 01.12.2003
English Hardcopy
In stock
82.35 USD
CSN EN 60749-36
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
Released: 01.12.2003
English Hardcopy
In stock
82.35 USD
English Hardcopy
In stock
94.12 USD
CSN EN 60749-14
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
Released: 01.06.2004
English Hardcopy
In stock
111.76 USD
CSN EN 60749-23
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Released: 01.12.2004
English Hardcopy
In stock
94.12 USD
CSN EN 60747-16-4
Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
Released: 01.05.2005
English Hardcopy
In stock
111.76 USD
CSN EN 60747-16-10
Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
Released: 01.05.2005
English Hardcopy
In stock
158.82 USD
CSN EN 61747-2-2
Liquid crystal display devices - Part 2-2: Matrix colour LCD modules - Blank detail specification
Liquid crystal display devices - Part 2-2: Matrix colour LCD modules - Blank detail specification
Released: 01.06.2005
English Hardcopy
In stock
111.76 USD
CSN IEC 60191-2W
Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
Released: 01.06.2000
English Hardcopy
In stock
35.29 USD