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CSN EN IEC 60747-5-5 ed. 2
Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers
Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers
Released: 01.03.2021
English Hardcopy
In stock
115.29 USD
CSN EN IEC 60749-15 ed. 3
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
Released: 01.03.2021
English Hardcopy
In stock
61.18 USD
CSN EN IEC 60749-30 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Released: 01.03.2021
English Hardcopy
In stock
71.76 USD
CSN EN IEC 60749-41
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
Released: 01.04.2021
English Hardcopy
In stock
81.18 USD
CSN EN IEC 62435-7
Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices
Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices
Released: 01.07.2021
English Hardcopy
In stock
81.18 USD
CSN EN IEC 63373
Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
Released: 01.10.2022
English Hardcopy
In stock
71.76 USD
English Hardcopy
In stock
108.24 USD
CSN EN 60749-31
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
Released: 01.12.2003
English Hardcopy
In stock
61.18 USD
CSN EN 60749-24
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
Released: 01.12.2004
English Hardcopy
In stock
61.18 USD
CSN EN 60749-33
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
Released: 01.12.2004
English Hardcopy
In stock
61.18 USD
CSN EN 61988-3-1
Plasma display panels - Part 3-1: Mechanical interface
Plasma display panels - Part 3-1: Mechanical interface
Released: 01.07.2006
English Hardcopy
In stock
81.18 USD
CSN EN 62435-5
Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices
Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices
Released: 01.09.2017
English Hardcopy
In stock
81.18 USD