PRICES include / exclude VAT
3587 Semiconductor elements
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
CSN EN IEC 60749-37 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Released: 01.06.2023
English Hardcopy
In stock
111.76 USD
CSN EN IEC 60747-16-7
Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators
Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators
Released: 01.07.2023
English Hardcopy
In stock
147.06 USD
CSN EN IEC 62228-5
Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers
Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers
Released: 01.12.2021
English Hardcopy
In stock
200.00 USD
CSN EN IEC 62435-9
Electronic components - Long-term storage of electronic semiconductor devices - Part 9: Special cases
Electronic components - Long-term storage of electronic semiconductor devices - Part 9: Special cases
Released: 01.04.2022
English Hardcopy
In stock
94.12 USD
CSN EN IEC 60749-34-1
Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module
Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module
Released: 01.02.2026
English Hardcopy
In stock
129.41 USD
English Hardcopy
In stock
129.41 USD
English Hardcopy
In stock
111.76 USD
CSN EN 62417
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010)
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010)
Released: 01.12.2010
English Hardcopy
In stock
82.35 USD
CSN EN 62258-1 ed. 2
Semiconductor die products - Part 1: Procurement and use
Semiconductor die products - Part 1: Procurement and use
Released: 01.05.2011
English Hardcopy
In stock
147.06 USD
CSN EN 62132-2
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
Released: 01.09.2011
English Hardcopy
In stock
111.76 USD
CSN EN 62047-5
Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
Released: 01.03.2012
English Hardcopy
In stock
129.41 USD
English Hardcopy
In stock
111.76 USD