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CSN EN 61747-2-2
Liquid crystal display devices - Part 2-2: Matrix colour LCD modules - Blank detail specification
Liquid crystal display devices - Part 2-2: Matrix colour LCD modules - Blank detail specification
Released: 01.06.2005
English Hardcopy
In stock
111.76 USD
CSN EN 60749-27
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Released: 01.03.2007
English Hardcopy
In stock
111.76 USD
CSN EN 62047-3
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
Released: 01.05.2007
English Hardcopy
In stock
94.12 USD
CSN EN 60749-38
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
Released: 01.10.2008
English Hardcopy
In stock
82.35 USD
CSN EN IEC 60749-37 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Released: 01.06.2023
English Hardcopy
In stock
111.76 USD
CSN EN IEC 60747-16-7
Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators
Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators
Released: 01.07.2023
English Hardcopy
In stock
147.06 USD
CSN EN IEC 60749-21 ed. 3
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
Released: 01.08.2026
English Hardcopy
In stock
111.76 USD
CSN EN IEC 60749-22-2
Semiconductor devices - Mechanical and climatic test methods - Part 22-2: Bond strength - Wire bond shear test methods
Semiconductor devices - Mechanical and climatic test methods - Part 22-2: Bond strength - Wire bond shear test methods
Released: 01.07.2026
English Hardcopy
In stock
129.41 USD
CSN EN IEC 60749-34-1
Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module
Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module
Released: 01.02.2026
English Hardcopy
In stock
129.41 USD
English Hardcopy
In stock
129.41 USD
English Hardcopy
In stock
111.76 USD
CSN EN 62417
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010)
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010)
Released: 01.12.2010
English Hardcopy
In stock
82.35 USD