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Homepage>CSN Standards>35 ELECTRICAL ENGINEERING>3587 Semiconductor elements>CSN EN 62132-2 - Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
Released: 01.09.2011
CSN EN 62132-2 - Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method

CSN EN 62132-2

Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method

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Number of Standard:CSN EN 62132-2
Category:358798
Pages:36
Released:01.09.2011
Catalog number:88990
DESCRIPTION

CSN EN 62132-2

CSN EN 62132-2 Tato norma definuje metody měření odolnosti integrovaného obvodu (IC) vůči radiovým kmitočtům (RF). Kmitočtový rozsah této metody je od 150 kHz do 1 GHz, anebo podle kmitočtové charakteristiky TEM článku.
Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.
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