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Released: 01.12.2011
CSN EN 60749-29 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
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English Hardcopy
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Number of Standard: | CSN EN 60749-29 ed. 2 |
Category: | 358799 |
Pages: | 36 |
Released: | 01.12.2011 |
Catalog number: | 89811 |
DESCRIPTION
CSN EN 60749-29 ed. 2
Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.