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Homepage>CSN Standards>35 ELECTRICAL ENGINEERING>3587 Semiconductor elements>CSN EN IEC 61967-8 ed. 2 - Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Released: 01.12.2023
CSN EN IEC 61967-8 ed. 2 - Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method

CSN EN IEC 61967-8 ed. 2

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method

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Number of Standard:CSN EN IEC 61967-8 ed. 2
Category:358798
Pages:28
Released:01.12.2023
Catalog number:517927
DESCRIPTION

CSN EN IEC 61967-8 ed. 2

CSN EN IEC 61967-8 ed. 2 Tato norma definuje metodu měření elektromagnetických emisí z integrovaného obvodu (IC) pomocí páskové vedení IC. Hodnocený integrovaný obvod je namontován na zkušební desce EMC (PCB) mezi aktivním vodičem a zemní rovinou uspořádání páskového vedení IC.
Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.
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