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Homepage>CSN Standards>35 ELECTRICAL ENGINEERING>3587 Semiconductor elements>CSN EN 62415 - Semiconductor devices - Constant current electromigration test (IEC 62415:2010)
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CSN EN 62415 - Semiconductor devices - Constant current electromigration test (IEC 62415:2010)

CSN EN 62415

Semiconductor devices - Constant current electromigration test (IEC 62415:2010)

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English Hardcopy
In stock
45.88 USD
Category:358771
Released:2010
Number of Standard:CSN EN 62415
DESCRIPTION

EN 62415


EN 62415 Semiconductor devices - Constant current electromigration test (IEC 62415:2010) - IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.

Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.
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