PRICES include / exclude VAT
Sponsored link
FREE SHIPPINGReleased: 2010
CSN EN 62415
Semiconductor devices - Constant current electromigration test (IEC 62415:2010)
Format
Availability
Price and currency
English Hardcopy
In stock
48.42 USD
Category: | 358771 |
Released: | 2010 |
Number of Standard: | CSN EN 62415 |
DESCRIPTION
EN 62415
EN 62415 Semiconductor devices - Constant current electromigration test (IEC 62415:2010) - IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.
Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.
Related products
English Hardcopy
In stock
57.89 USD
English Hardcopy
In stock
48.42 USD
CSN EN 62416
Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010)
Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010)
Released: 2010
English Hardcopy
In stock
48.42 USD
English Hardcopy
In stock
81.05 USD
English Hardcopy
In stock
81.05 USD
English Hardcopy
In stock
66.32 USD
English Hardcopy
In stock
88.42 USD
CSN EN 60749-16
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
Released: 2003
English Hardcopy
In stock
48.42 USD
English Hardcopy
In stock
88.42 USD
CSN EN 60749-1
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Released: 2003
English Hardcopy
In stock
57.89 USD