Log inSign up
LANGUAGE en
Menu
STOREABOUT US Help centerContactsDelivery chargesNews
SEARCH
0
Total price
0 USD
PRICES include / exclude VAT
Homepage>CSN Standards>35 ELECTRICAL ENGINEERING>3587 Semiconductor elements>CSN EN 62415 - Semiconductor devices - Constant current electromigration test (IEC 62415:2010)
Sponsored link
FREE SHIPPINGReleased: 2010
CSN EN 62415 - Semiconductor devices - Constant current electromigration test (IEC 62415:2010)

CSN EN 62415

Semiconductor devices - Constant current electromigration test (IEC 62415:2010)

Format
Availability
Price and currency
English Hardcopy
In stock
48.42 USD
Category:358771
Released:2010
Number of Standard:CSN EN 62415
DESCRIPTION

EN 62415


EN 62415 Semiconductor devices - Constant current electromigration test (IEC 62415:2010) - IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.

Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.
Related products
CSN EN 62047-6
Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009)
Released: 2010
English Hardcopy
In stock
57.89 USD
CSN EN 62417
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010)
Released: 2010
English Hardcopy
In stock
48.42 USD
CSN EN 62416
Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010)
Released: 2010
English Hardcopy
In stock
48.42 USD
CSN EN 62418
Semiconductor devices - Metallization stress void test (IEC 62418:2010)
Released: 2010
English Hardcopy
In stock
81.05 USD
CSN EN 60191-6-21
Mechanical standardization of semiconductor devices - Part 6-21: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of small outline packages (SOP) (IEC 60191-6-21:2010)
Released: 2010
English Hardcopy
In stock
81.05 USD
CSN EN 60191-6-20
Mechanical standardization of semiconductor devices - Part 6-20: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of small outline J-lead packages (SOJ) (IEC 60191-6-20:2010)
Released: 2010
English Hardcopy
In stock
66.32 USD
CSN EN 61964
Integrated circuits - Memory devices pin configurations
Released: 1999
English Hardcopy
In stock
88.42 USD
CSN EN 60749-16
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
Released: 2003
English Hardcopy
In stock
48.42 USD
CSN EN 61967-5
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method
Released: 2003
English Hardcopy
In stock
88.42 USD
CSN EN 60749-1
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Released: 2003
English Hardcopy
In stock
57.89 USD
Print