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>CSN Standards>35 ELECTRICAL ENGINEERING>3584 Piezoelectric components and ferrite cores>CSN EN IEC 62276 ed. 4 - Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
Released: 01.10.2025
CSN EN IEC 62276 ed. 4 - Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

CSN EN IEC 62276 ed. 4

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

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Number of Standard:CSN EN IEC 62276 ed. 4
Category:358417
Pages:52
Released:01.10.2025
Catalog number:521961
DESCRIPTION

CSN EN IEC 62276 ed. 4

CSN EN IEC 62276 ed. 4 This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators.
Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.
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