CSN EN IEC 63185 ed. 2

CSN EN IEC 63185 ed. 2 This document relates to a measurement method for complex permittivity of dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes and that of fringing fields are taken into account accurately on the basis of the mode-matching analysis.
Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.